Wavelet-Based Image Indexing Techniques
with Partial Sketch Retrieval Capability

James Z. Wang, Gio Wiederhold, Oscar Firschein, Sha Xin Wei
Stanford University, Stanford, CA 94305

This paper describes WBIIS (Wavelet-Based Image Indexing and Searching), a new image indexing and retrieval algorithm with partial sketch image searching capability for large image databases. The algorithm characterizes the color variations over the spatial extent of the image in a manner that provides semantically-meaningful image comparisons. The indexing algorithm applies a Daubechies' wavelet transform for each of the three opponent color components. The wavelet coefficients in the lowest few frequency bands, and their variances, are stored as feature vectors. To speed up retrieval, a two-step procedure is used that first does a crude selection based on the variances, and then refines the search by performing a feature vector match between the selected images and the query. For better accuracy in searching, two level multiresolution matching may also be used. Masks are used for partial-sketch queries. This technique performs much better in capturing coherence of image, object granularity, local color/texture, and bias avoidance than traditional color layout algorithms. When tested on a database of more than 10,000 general-purpose images, WBIIS is much faster and more accurate than traditional algorithms.

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Citation: James Z. Wang, Gio Wiederhold, Oscar Firschein and Sha Xin Wei, ``Wavelet-Based Image Indexing Techniques With Partial Sketch Retrieval Capability,'' Proc. IEEE Forum on Research and Technology Advances in Digital Libraries (ADL'97), pp. 13-24, Washington, D.C., IEEE, May 1997.

Copyright 1997 IEEE. Published in the Proceedings of ADL'97, May 7-9, 1997 in Washington D.C. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works, must be obtained from the IEEE. Contact: Manager, Copyrights and Permissions / IEEE Service Center / 445 Hoes Lane / P.O. Box 1331 / Piscataway, NJ 08855-1331, USA. Telephone: + Intl. 908-562-3966.

Last Modified: Thu Apr 14 13:11:49 EDT 2005
1997, James Z. Wang