Jaewon Yang
Ph.D CandidateMember of Stanford InfoLab
Department of Electrical Engineering
Advisor : Prof. Jure Leskovec
Contact
Gates Building, Room 414353 Serra Mall
Stanford, CA 94305
jaewonyang [at] stanford [dot] edu
Research Interests
- Network community detection
- Statistical models for data mining
- Nonnegative matrix factorization
Publications
Overlapping Community Detection at Scale: A Nonnegative Matrix Factorization Approach by J.Yang and J.Leskovec, ACM International Conference on Web Search and Data Minig (WSDM), 2013.
Community-Affiliation Graph Model for Overlapping Community Detection by J.Yang and J.Leskovec, IEEE International Conference On Data Mining (ICDM), 2012.
Defining and Evaluating Network Communities based on Ground-Truth by J.Yang and J.Leskovec, IEEE International Conference On Data Mining (ICDM), 2012.
Structure and Overlaps of Communities in Networks by J.Yang and J.Leskovec, SNA-KDD Workshop held in conjuction with ACM SIGKDD Conference on Knowledge Discovery and Data Mining, 2012.
Patterns of Temporal Variation in Online Media by J.Yang and J.Leskovec, ACM International Conference on Web Search and Data Minig (WSDM), 2011. [Data] [Code] In the press: MIT Tech Review
Modeling Information Diffusion in Implicit Networks by J.Yang and J.Leskovec, IEEE International Conference On Data Mining (ICDM), 2010. Best application paper award [Data & Code] In the press: New York Times
Education
Ph.D Candidate, Electrical Engineering, Stanford University, Stanford, CA.MS, Statistics, Stanford University, Stanford, CA, 2012.
BS, Electrical Engineering, Seoul National University, Seoul, Korea, 2007.
Honors and Awards
- Best Application Paper Award, IEEE ICDM, 2010
- Doctorate Fellowship, Samsung Scholarship, 2007~2012
- Undergraduate Fellowship, Korea Foundation for Advanced Studies, 2002~2006
- Gold prize (ranked 2nd in South Korea), National Contest of Science by the Korean Ministry of Education, 1999
Professional Activities
- Program Committee: CIKM 2013
- Reviewer: Social Networks, ACM TWeb, IEEE TKDE, IEEE MM